On Sensor Node Failure Diagnosis using Consumed Power Traces

2020년 9월 9일

M. Khan, H. Le, M. Lemay, P. Moinzadeh, L. Wang, Y. Yang, D. Noh, T. Abdelzaher, C. Gunter, J. Han, and X. Jin,
“On Sensor Node Failure Diagnosis using Consumed Power Traces,”
Proc. ACM/IEEE International Conference on Information Processing in Sensor Networks (IPSN’10),
Apr. 2010, Stockholm, Sweden. (Acceptance ratio: 19%-11/58) Link